Instrumental Hardware Configuration
Instrument Type: CAMECA SX100
Electron Optical Column Specifications
Accelerating Voltages: up to 50 KV
Beam Currents: automatic regulation in the range 1-1000 nA; manual control to lower currents
Analytical Configuration
1. X-ray take-off geometry: 40°
2. Wavelength dispersive spectrometers: five, asynchronous, configured as
Spec.# | Type* | Diffraction Devices |
|---|---|---|
1 | LP | TAP, PET, PC0(2d=45Å) , PC1(2d=62.5Å) |
2 | LP | TAP, PET |
3 | HP | LiF, PET |
4 | HP | LPET, LLiF |
5 | LP | TAP, PET, PC3 (2d=200Å), PC2 (2d=95Å) |
* HP: High-pressure (26-33 psi) P10 gas, 6 mm mylar window at column and detector
* LP: Low-pressure (2-4 psi) P10 gas, thin polypropylene windows at column and detector
3. Energy Dispersive X-Ray Detector: Thermo Ultra-Dry Silicon Drift Detector running under NORAN System Seven automation.
Imaging Hardware
Secondary Electron Detector: Cameca Standard
Backscattered Electron Detector: Cameca TV rate, variable-gain (fast) BSE
Cathodoluminescence Detector: GATAN PanaCL/F with removable RGB wavelength-band filters
Automation
Our SX100 is equipped with both CAMECA PEAKSIGHT software and John Donovan’s full Probe for EPMA system.
