Transmission Electron Microscopy (TEM)

Transmission electron microscopy examines structure by passing electrons through the specimen. The image is formed as a shadow of the specimen on a phosphorescent screen. In order for electrons to pass through the specimen, it must be very thin (usually less than 100 nanometers or approx. 1/25,000 inch) thick. This requires considerable preparation equipment, time and skill. TEM is typically used to examine the internal structure of objects that are as varied as biological specimens, to rocks, to metals, to ceramics.

The SRNML has the following TEMs:

JEOL 2000-FX intermediate voltage (200,000 volt) scanning transmission research electron microscope (configured for both biological and physical sciences specimens)

  • magnification: X 50 to X 1,000,000
  • 1.4 Ångstom resolution (LaB6 source)
  • backscattered and secondary electron detectors
  • Gatan Digi-PEELS Electron Energy Loss Spectrometer, software and off axis imaging camera
  • Kevex Quantum 10 mm2 X-ray detector (detects elements down to boron), with spatial resolution to as little as 20 nanometers (on thin sections)
  • IXRF X-ray analyzer with digital imaging capability, X-ray mapping, feature analysis and quantitative software.
  • Gatan Be double-tilt analytical holder for quantitative X-ray work
  • Gatan cryo-TEM specimen holder (to -150°C)

ZEISS 10A conventional transmission electron microscope (100,000 volts)

  • magnification X100 to 200,000)
  • 3.4 Ångstrom resolution (point to point)
  • microscope used for student instruction

JEOL 2010-F intermediate voltage (200,000 volt) field emission high resolution scanning transmission research electron microscope

  • magnification: X 50 to X 1,000,000
  • high resolution field emission source producing a coherent electron beam
  • Planned Gatan GIF and Electron Energy Loss Spectrometer
  • Planned X-ray detector (detects elements down to boron), with spatial resolution to as little as 20 nanometers (on thin sections)
  • X-ray analyzer with digital imaging capability, X-ray mapping, feature analysis and quantitative software.
  • Gatan Be double-tilt analytical holder for quantitative X-ray work
  • Gatan cryo-TEM specimen holder (to -150°C)
  • Planned installation date: March-April 2006

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